Thin Film Measurement
Microscope Thin Film Measurement
Powerful system for layer thicknesses between 50 nm and 50 µm.
Semiconductor Fabrication:
- Photoresist
- Oxides
- Nitrides
Liquid Crystal Displays:
- Cell Gaps
- Polyimides
- ITO
Optical Coatings:
- Hardness Coatings
- Anti-Reflection Coatings
- Filters
Promicron DM12000-TF
Universal semiconductor microscope with option for layer thickness measurement.