Thin Film Measurement

Microscope Thin Film Measurement

Powerful system for layer thicknesses between 50 nm and 50 µm.

Semiconductor Fabrication:

  • Photoresist
  • Oxides
  • Nitrides

Liquid Crystal Displays:

  • Cell Gaps
  • Polyimides
  • ITO

Optical Coatings:

  • Hardness Coatings
  • Anti-Reflection Coatings
  • Filters

Promicron DM12000-TF

Wafer 9A

Universal semiconductor microscope with option for layer thickness measurement.


Please calculate 9 plus 7.